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Accoustic Microscopes from KSISAM

v-Series / v 300

 © The all new KSI v300 Scanning Acoustic Microscope is available now. Including all the best of previous KSI systems, it additionally comes with the most advanced new features for SAM technology.

• All-in-one Scanning Acoustic Microscope for inspection of flipchip, stacked DIE, IGBT, wafer, MLCC, solar cells, andother semiconductor as well as material science applications
• Matchless vibration decoupling granite design and high speed linear drive with max. moving speed 2.000 mm/s, and maximum acceleration 30.000 mm/s²
• Unique FCT™ (Fluid Cut Technology) Transducer

Key features of the v 300

  • Scan Envelope: 300mm x 300mm
  • Ergonomic, user-friendlycoverforeasy sample placement
  • Sample tank 546 mm x 860 mm x 120 mm with water drainage valve
  • Compact design 885 x 900 x 1332 mm (WxDxH)
 

v-Series

v-Series

The v-Series is a new generation of scanning acoustic microscopes. Based on a new developed high speed scanning mechanic and the new patented FCT transducer...

Custom SAM Solutions

We develop in close cooperation with the customer special solutions for almost every kind of SAM sample analysis. Our long years of experience based on...

Retrofits / Options

Almost all KSI SAM system can be retrofitted or upgraded to expand their functions, performance and operation. Depending on the existing SAM there several...